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|View Historical Prices for AEHR - The WSJ||View Performance/Total Return for AEHR - Morningstar|
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Aehr Test Systems to Announce Fiscal 2018 Fourth Quarter and Full Year Financial Results on July 19, 2018
Posted on Wednesday July 11, 2018
FREMONT, Calif., July 11, 2018-- Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its fiscal 2018 fourth quarter ...
Aehr Test Systems to Participate in 10th Annual CEO Investor Summit 2018 in San Francisco July 11
Posted on Monday July 09, 2018
FREMONT, Calif., July 09, 2018-- Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, president and CEO, and Ken Spink, CFO, will participate ...
Aehr Test Systems to Exhibit at SEMICON West in San Francisco July 10-12, 2018
Posted on Monday July 02, 2018
Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test in booth 5381 at SEMICON West 2018, taking place July 10-12 at the Moscone Convention Center in San Francisco, California. In addition, Aehr Test President and CEO Gayn Erickson will be presenting the keynote address to the attendees at this year’s Test Vision 2020 conference on Wednesday, July 11 at 10am Pacific. Held in conjunction with SEMICON West, the conference is today's premier workshop for semiconductor and system test experts that includes providers and users of test IP and equipment and is organized with a vision towards the future of test, to discuss upcoming trends, innovations, and requirements.
Aehr Test Systems to Exhibit at the Semiconductor Wafer Test Workshop June 3-6, 2018 in San Diego, CA
Posted on Friday June 01, 2018
Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be exhibiting at the Semiconductor Wafer Test Workshop (SWTW) taking place June 3-6, 2018 at the Rancho Bernardo Inn in San Diego, California (Booth #7). The Company will be showcasing its solutions for wafer-level burn-in and test of logic, optical and memory devices, including its FOX-XP next generation test and burn-in system for high volume production and early failure rate (EFR) test. The FOX-XP system has been developed to burn-in and test today’s next generation of devices being integrated into automotive, mobility, and security (including facial and gesture recognition) products, enabling volume production test and burn-in of wafers and chip-scale packages for those applications.